Thales Exenberger Becker

My Ph. D. work at Universidade Federal do Rio Grande do Sul (UFRGS), Brazil, comprised the electrical characterization of MIM-type resistive switching devices, especially on the analysis of Random Telegraph Noise. I have almost six years of research experience in the topics of reliability and characterization of MIM-like RS devices, thin-film transistors, and circuits, including low-frequency noise, bias temperature instability (BTI), and radiation effects.

graduation at Engenharia Elétrica from Universidade Federal do Rio Grande do Sul (2015) and master's at Electric Engineering from Universidade Federal do Rio Grande do Sul (2018). Has experience in Electric Engineering