tipo
- journal article
Charge deposition analysis of heavy-ion-induced single-event burnout in low-voltage power VDMOSFET
Documento
- doi:10.1016/j.microrel.2022.114784
- http://dx.doi.org/10.1016/j.microrel.2022.114784
- http://https://doi.org/10.1016/j.microrel.2022.114784][doi:10.1016/j.microrel.2022.114784
- http://https://www.sciencedirect.com/science/article/pii/S0026271422003080][doi:10.1016/j.microrel.2022.114784
- https://www.sciencedirect.com/science/article/pii/S0026271422003080?via%3Dihub][doi:10.1016/j.microrel.2022.114784
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