Gilson I. Wirth received the B.S.E.E and M.Sc. degrees from the Universidade Federal do Rio Grande do Sul, Brazil, in 1990 and 1994, respectively. In 1999 he received the Dr.-Ing. degree in Electrical Engineering from the University of Dortmund, Dortmund, Germany.
He is currently a professor at the Electrical Engineering Department at the Universidade Federal do Rio Grande do Sul - UFRGS (since January 2007), where he was the head of graduate and undergraduate courses.
From July 2002 to December 2006 he was professor and head of the Computer Engineering Department, Universidade Estadual do Rio Grande do Sul (UERGS).
His research work is focuses on reliability and yield of MOS devices and circuits, including low-frequency noise, bias temperature instability (BTI), radiation effects, and design techniques to improve yield and reliability.
He has stablished successful collaborative work with different companies and research groups in Europe, North and South America, and China.
He is currently a Distinguished Lecturer of the IEEE Electron Devices Society. He was a Distinguished Lecturer of the IEEE Circuits and Systems Society (term 2010 to 2011).
